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Title: Introduction to Metrology
Url: http://nano4me.live.subhub.com/downloads/20130318_2
Publisher: National Center for Nanotechnology Applications and Career Knowledge
Description:

This document, created by Pennsylvania State University and hosted by the Nanotechnology Applications and Career Knowledge Network, serves as a guide for an activity where students are introduced to three tools that are used for measurement throughout the course of the fabrication process: profilometers, ellipsometers, and optical microscopes. The activity guide includes objectives, background information on the purpose of the three tools, and a detailed description of each, including a video demonstrating their use, and post-activity questions to test student comprehension. In order to access and download this material, users must complete a free registration.

LC Classification: Science -- Physics -- Study and teaching. Research -- Physical measurements (General)
GEM Subject: Science -- Technology
Key Concept: Manufacturing -- Nanofabrication
Date Issued: 2013
Resource Type: Instructional Material
Instructional Material -- Problem Set
Instructional Material -- Experiment/Lab Activity
Format: Document -- PDF
Document -- HTML
Audience: Educator
Education Level: Higher Education -- Undergraduate (Lower Division)
Language: English
Rights: The Pennsylvania State University
Access Rights: Free access with registration
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