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Title: Hall Effect Measurements
Url: https://www.nist.gov/pml/nanoscale-device-characterization-division/po...
Publisher: National Institute of Standards and Technology (U.S.)
Description: The objective of this Web site is twofold: (1) to describe the Hall measurement technique for determining the carrier density and mobility in semiconductor materials and (2) to initiate an electronic interaction forum where workers interested in the Hall effect can exchange ideas and information. It includes an introductory description of the Hall measurement technique and covers basic principles, equipment, and recommended procedures. Keywords: Conductance, conductivity, resistance, resistivity
LC Classification: Science -- Physics -- Electricity and magnetism -- Electricity -- Electric current (General)
Science -- Physics -- Electricity and magnetism -- Electricity -- Electric current (General) -- Electric conductivity -- Other special topics, A-Z -- Hall effect
Technology -- Electrical engineering. Electronics. Nuclear engineering -- Electrical engineering. Electronics. Nuclear engineering -- Electronics -- Apparatus and materials -- Other, A-Z -- Hall effect devices
Technology -- Electrical engineering. Electronics. Nuclear engineering -- Electrical engineering. Electronics. Nuclear engineering -- Electronics -- Apparatus and materials -- Semiconductors
GEM Subject: Science -- Engineering
Science -- Technology
Science -- Instructional issues
Key Concept: Physics -- Currents
Physics -- Semiconductors
Manufacturing -- Measurement
Date Issued: 2010-04-29
Resource Type: Reference Material
Instructional Material
Instructional Material -- Demonstration
Format: Document -- HTML
Audience: Educator
Professional/Practitioner
Education Level: Higher Education
Higher Education -- Graduate/Professional
Higher Education -- Undergraduate (Lower Division)
Higher Education -- Undergraduate (Upper Division)
Higher Education -- Technical Education (Upper Division)
Higher Education -- Technical Education (Lower Division)
Vocational/Professional Development Education
Language: English
Access Rights: Free access
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Source Type: ATE Center
Source: NetWorks
Full Record Views: 21
Resource URL Clicks: 29
Cumulative Rating: NOT YET RATED
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