This activity, created by Pennsylvania State University and the Nanotechnology Applications and Career Knowledge Center (NACK), serves as a guide for students who want to gain hands-on experience in Atomic Force Microscope (AFM) and Scanning Electron Microscopy (FESEM) imaging techniques. The document outlines the steps students should take to familiarize themselves with their available microscopy equipment and skills they should become comfortable with on both types of imaging, including laser alignment and image capture for the atomic force microscope, and working distance and wobble for the scanning electron microscope. In order to access and download this material, users must complete a free registration.