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Title: Introduction to Scanning Probe Microscopy
Url: https://asdlib.org/onlineArticles/ecourseware/Bullen/SPMModule.htm
Creator: Bullen, Heather
Wilson, Robert
Publisher: Northern Kentucky University. Dept. of Chemistry
Description: This learning module teaches the principles behind scanning tunneling microscopy and atomic force microscopy. The module includes example applications and ample literature citations. Scanning tunneling (STM), atomic force (AFM), lateral (friction) force, magnetic force, chemical force and phase imaging are discussed.
LC Classification: Science -- Chemistry -- Analytical chemistry
Science -- Natural history. Biology -- Natural history (General) -- Microscopy
Science -- Natural history. Biology -- Natural history (General) -- Microscopy -- Microscopes -- Special microscopes, A-Z -- Atomic force microscopes
Science -- Natural history. Biology -- Natural history (General) -- Microscopy -- Microscopes -- Special microscopes, A-Z -- Scanning probe microscopes
Science -- Natural history. Biology -- Natural history (General) -- Microscopy -- Microscopes -- Special microscopes, A-Z -- Scanning tunneling microscopes
GEM Subject: Science -- Chemistry
Science -- Biology
Science -- Technology
Science -- Instructional issues
Date Issued: 2007-02-16
Resource Type: Reference Material
Instructional Material
Instructional Material -- Interactive Simulation
Instructional Material -- Instructor Guide/Manual
Format: Document -- PDF
Document -- HTML
Audience: Educator
Learner
Education Level: Higher Education
Higher Education -- Undergraduate (Lower Division)
Higher Education -- Undergraduate (Upper Division)
Higher Education -- Technical Education (Upper Division)
Higher Education -- Technical Education (Lower Division)
Vocational/Professional Development Education
Language: English
Access Rights: Free access
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Source: Analytical Sciences Digital Library
Full Record Views: 31
Resource URL Clicks: 15
Cumulative Rating: NOT YET RATED
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